11 nov 2019 - 15 nov 2019 [open in google calendar]
Erwin Schrödinger International Institute (ESI), Vienna
The symposium aims at presenting the state of the art and the most recent advancements in the derivation, validation, and implementation of reliable models for the characterization of interface crystalline morphologies and thin-film growth.
Main topics include mathematical modeling, calculus of variations, partial differential equations, geometric measure theory, continuum mechanics, discrete-to-continuum passage. Contributions from physicists regarding the modeling and the experimental level are also awaited.
A list of expected speakers and additional informations can be found at the webpage:
To register it suffices to send an e-mail to email@example.com. Some financial support might be available for PhD students and postdocs at an early career stage.
Organizers: Ulrike Diebold, Irene Fonseca, Paolo Piovano.